The values of sheet CYT387 research buy resistance have been also confirmed by the modified two-point technique  as an alternative method for sheet resistance determination. The surface morphology of glass and Au-metalized glass was examined using AFM in tapping mode under ambient conditions with a CP II Veeco microscope
(Bruker Corp., Santa Barbara, CA, USA). An etched Si probe (doped with P), RTESPA-CP, with spring constant of 20 to 80 N m−1 was used. The average mean roughness (R a) represents the arithmetic average of the deviations from the center plane of the samples. All samples have been measured repeatedly at three different areas on two samples; the error in the surface roughness measurement did not exceeded 7%. The UV–vis spectra were measured using a PerkinElmer Lambda
25 spectrometer (PerkinElmer Inc., Waltham, MA, USA) in the spectral range from 330 to 1100 nm. Rutherford backscattering (RBS) analyses were performed on Tandetron Saracatinib cost 4130MC accelerator (Center of Accelerators and Nuclear Analytical Methods, Nuclear Physics Institute of the ASCR, Řež, Czech Republic) using 1.7 MeV 4He ions. The RBS measurement was realized at the CANAM infrastructure. The measurements were performed in IBM geometry with incident angle 0°, and laboratory scattering angle of 170°. The typical energy resolution of the spectrometer FGFR inhibitor was FWHM = 15 keV. The RBS spectra were evaluated using SIMNRA and GISA softwares. Results and discussion Electrical properties of Au structures The dependence of the sheet resistance (R s) on the Au layer thickness is introduced in Figure 1. With increasing layer thickness, the R s of the gold layer decreases as expected. Etofibrate The difference was found when the compared gold nanolayers evaporated on glass at room temperature and 300°C. The sharp decrease of the sheet resistance was observed (RT and annealing) for the thicknesses above 10 nm when an electrically continuous layer is formed. This is a rather different behavior from the sputtered
Au nanolayers, when the formation of electrically continuous layer was shifted to higher thicknesses due to thermal annealing . This is in contrast with the results obtained in this work for gold nanolayers deposited by evaporation. The threshold for the formation of electrically continuous layers is both for non-annealed and annealed nanolayers ca. 10 nm. This finding may be caused due to different adhesive force of gold prepared by evaporation in comparison to sputtering technique. Due to that fact the surface diffusion is suppressed, the local melting and mass redistribution are being probably preferred. A rather different situation was found for the layers evaporated on the glass, which is already heated to 300°C. Due to higher temperature of the glass during the deposition process, the surface diffusion takes place, which results in significant shift for the electrically continuous layer formation.